Santec has used an innovative cavity design to lower the optical ASE noise, resulting in an extraordinarily high signal-to-noise ratio of over 90dB/0.1nm, while also maintaining a high output power of over +10dBm. The TSL-550 is ideal for next generation components testing driven by innovations in Dense Wavelength Division Multiplexing (DWDM), passives and Wavelength Selective Switches (WSS) that require characterization of multi-input,high extinction ratio devices. The TSL-550 is designed to improve production inspection throughput by doubling the scan repetition rate over conventional lasers. In addition, the TSL-550 is available for WDL and PDL measurement with the support of our power meter, MPM-200 and dedicated software.
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